otal Engineering Service
Foundry & ASIC Service
Design & Layout
Hardware
Software
Special IPs
ESD / EMI
IC LEVEL ESD SOLUTION
SET LEVEL ESD SOLUTION
Production management
ESD / EMI
SET LEVEL ESD SOLUTION
API사가 미국 미조리대와 공동개발을 통해 상용화한 ESD/EMI Scanning System (SmartScan)은 세계적으로 유일한
Set Level의 ESD / EMI Debugging System 입니다. 최근까지 IC level ESD와 Set Level ESD 간의 연관성을 해석하기가
매우 어려웠으며, 본 System은 이를 획기적으로 개선하는 탁월한 성능을 자랑하고 있습니다. 특히 Module / Board상의
ESD / EMI 특성을 신속하고 정확하게 측정하여 불량한 IC를 선별하여줌으로써 개발 일정 단축과 Cost 절감 효과에
크게 기여하고 있습니다.
 

With the increasing sophistication and finer geometry, integrated circuits(“ICs”) and systems are becoming more
susceptible to EMC failures, and yet, today’s EMC, especially ESD, correction still resorts to blinded trial-and-error;
there is no convenient way to identify the source of an EMC failure. Having to rely on such brute-force method,
system manufacturers are faced with excessive correction costs, high system development cost, extensiv
engineering hours, and worse yet, delayed product launch.

SmartScan is the world’s first system-level electromagnetic immunity evaluation tool that can pinpoint the exact spot on a board/system that is prone to EMC failure. This is made possible by SmartScan’s (a) consistent results between system test and test of ICs mounted on the board (“Test Versatility”), (b) consistent measurements between test trials (“Test Repeatability”), and (c) ability to drill EMC testing down to a pin on an IC (“Test Precision”).
 
An ESD event radiates electromagnetic interference in two forms.
E-field and H-field. When the fields are coupled into a board trace or IC pin, a current is produced. If the current is sufficiently large and lasts for a sizable duration, it can cause IC damage. Such damage can easily be identified visually.

Unfortunately, some currents cause a momentary malfunction of the system without IC damage. Such malfunction may be as crippling as IC damage but identifying the area affected is extremely difficult. The spot(s) where the induced current couples with the system can be anywhere since radiated fields can travel freely within the system’s enclosure.
 
 
 
 
   Two electromagnetic susceptibility maps below illustrate SmartScan showing consistent measurements
 between two different trials; Test Repeatability.


 

 
   Identifying weak pins from weak area.

 

 
   SmartScan scanning two functionally comparable ICs mounted on same board. The test result shows that the IC from supplier “B” is better than the IC from supplier “A” with respect to electromagnetic immunity.


 

 
   SmartScan scanning cell phone display
 H-field scan clearly shows problem area. Monitoring of one of TP’s during crash by direct probing shows signal fluctuation.

 

SmartScan BASIC
     The BASIC is manually operated system for performing susceptibility scanning at the system level. This system
     includes:
      - 4kV pulse generator for ESD susceptibility testing
      - 4kV Probes : 5mm Flat. H Field Probe
                                1mm Vertical H Field Probe
                                5mm E Field Probe
SmartScan AUTOSCAN
     The AUTOSCAN is an automated scanner providing both control and analysis capability to identify susceptibility
     problems and includes:
      - 4kV pulse generator for ESD susceptibility testing
      - Full 3 dimensional scanner table under software control
         (X and Y motion clearance = 20cm; Z= 10cm)
      - Basic analysis software
      - Internal controller and display
      - Alignment Probe
      - 4kV Probes : 5mm Flat. H Field Probe
                                 1mm Vertical H Field Probe
                                 5mm E Field Probe
SmartScan PROFESSIONAL
     The PROFESSIONAL is the most sophisticated automatic scanning system for susceptibility with the highest
     level of control and analysis. Included with this systems:

      - 8kV pulse generator using dual supplies for
         ESD susceptibility testing
      - Full 3 dimensional scanner table under
        computer control including Phi control
          (X and Y motion clearance = 40cm)
      - Detection Unit for monitoring EUT voltage
         and current
      - Software monitoring of the EUT
      - Resonance Scanning to identify resonant
         circuits and nodes
      - Camera for monitoring probe locations and
         software
      - analysis of sensitive sites
      - EMI Scanning
      - On site installation and traning
      - Alignment Probe
      - Resonance Scanning Probe
      - 8kV Probe Set: 5mm Flat H Field Probe
                                    50mm H Field Loop Probe
                                    1mm Vertical H Field Probe
                                    5mm E Field Probe
                                    50mm E Field Probe
      - EUT Reset control to re-boot the EUT if necessary following system upset
SmartScan AUTOSCAN EMI
     The AUTOSCAN EMI is an automated EMI scanner providing both control and analysis capability to identify
     sources of EMI from boards and systems. This unit includes :
      - Full 3 dimensional scanner table under
         software control
         (X and Y motion clearance = 40cm)
      - EMI analysis software
      - Internal controller and display
      - Alignment Probe
      - EMI Probes : 5mm Flat H Field Probe
                                1mm Vertical H Field
                                Probe
                                5mm E Field Probe
 
  BASIC AUTOSCAN AUTOSCAN EMI PROFESSINAL
4kV generator Included Included Optional  
4kV Basic Probe Set(1mm and 5mm E&H probes) Included Included Included  
3 Dimensional Scanner Table w/o Phi control   Included Included  
Basic Analysis Software   Included    
EMI Analysis Software     Included Included
Internal Controller and Display   Included Included Included
Alignment probe   Included Included Included
8kV single supply generator   Optional Optional  
8kV dual supply generator       Included
3 Dimensional Scanner Table with Phi control   Optional Optional Included
Failure Detection Unit for monitoring EUT V&I     Optional Included
Software monitoring of EUT       Included
Resonance Scanning   Optional Optional Included
EUT Rest control to re-boot EUT       Included
Camera for monitoring Probe locations in software       Included
EMI Scanning w/optional Agilent Analyzer   Optional Included Included
On site installation and training   Optional Optional Included
8kV Basic Probe Set (1mm and 5mm E&H probes) Optional Optional Optional Included
8kV Basic Probe Set (1mm and 5mm E&H probes) Optional Optional Optional Included
8kV Expanded Probe set (adds 50mm probes)   Optional Optional Optional
Calibration Board for field probes   Optional Optional Optional
High Voltage Power Attenuator Optional Optional Optional Optional
Sine Wave scanning to 6GHz   Optional Optional Optional
EFT Scanning   Optional Optional Optional
Expanded 3 Dimensional scanner for large systems   Optional Optional Optional