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| IC LEVEL ESD SOLUTION |
(ÁÖ)¼¼¹Ì¼Ö·ç¼ÇÀº ¹Ì±¹ GTL»ç¿ÍÀÇ Á¦ÈÞ¸¦ ÅëÇØ ¹Ì±¹ ƯÇãÀÇ Non-Snap back ¹æ½ÄÀÇ ESD protection IP¿Í À̸¦ ÀÌ¿ëÇÑ ESD protection Design Service ¹× ConsultingÀ» Á¦°øÇϰí ÀÖ½À´Ï´Ù. GTL»çÀÇ ESD protection solutionÀº ±âÁ¸ ESD I/O protection ¹æ½Ä°ú´Â ±Ùº»ÀûÀ¸·Î Â÷À̰¡ ÀÖÀ¸¸ç, IC ¼³°è ´Ü°èºÎÅÍ IC Core ³»ºÎÀÇ ÀüüÀûÀÎ Power domainÀ» ESD¿¡
È¿°úÀûÀ¸·Î ´ëÀÀÇÒ ¼ö ÀÖµµ·Ï solutionÀ» Á¦°øÇϰí ÀÖ½À´Ï´Ù.
ƯÈ÷ Foundry ¹× Process ȣȯ¼ºÀÌ ÀÖ¾î ¿ëÀÌÇÏ°Ô Àû¿ë°¡´ÉÇϸç, »çÀü SimulationÀ» ÅëÇØ IC Á¦ÀÛÀ» ÇÏÁö¾Ê°íµµ ESD
Ư¼ºÀ» ¹Ì¸® ÆÄ¾ÇÇÒ¼öÀÖ´Â °ÍÀº GTL»ç ESD solution¸¸ÀÇ Æ¯ÈµÈ ÀåÁ¡ÀÔ´Ï´Ù. |
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Device simulators like Medici(Pisces), Davinci, etc., have been used almost 20years to simulate a vaiety of effects, including latch-up and ESD. They are quite complicated to use, but provide good physics, including geometry effects. However, device simulators have their own set of problems, such as, run out of grid nodes quickly and 3D simulators are too slow.
Circuit simulators like Spice have been used, but not as successfully because they cannot deal very well with geometrical effects, and especially temperature coupling.
GTLeader in alliance with Sequoia Design Systems can provide accurate ESD/LU simulation to provide much
greater understanding of what is happening in the devices and circuits during failure. This insight is almost impossible to obtain from experimental data alone.
GTLeader sratt have used simulation to predict failur mechanisms from 3um down to 90nm technologies.
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Long testing due to ever increasing chip size, and repeated zapping to the same pin cause serious testing artifacts.
Current JEDEC spec and testing methodologies were developed some time ago. ESD testing labs interprete the JEDEC spec in their own way
ESD/LU testing without "side effects" |
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GTLeader
provider
optimized
pin
reduction
method
based
on
I/O
ESD
protection
and
power
rail
protection
scheme analysis -
Split
test
method
to
avoid
charging/cumulative
stres
effects
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Resident expertise on all required testing standards |
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ESDA/JEDEC standards: HBM, MM and CDM testing
- ESDA standards: TLP, TLU
- ESDA system level standard: calibration method
- AEC & EIA/JEDEC standard: static and vectored LU
- IEC 6000-4-2 system level (Human-Metal) standard
- AEC automotive standard for HBM, MM and CDM
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Guaranteed ESD testing |
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GTLeader will backup test result for you when your customer raises any question on testing that GTLeader has provided.
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Application into Designs Case I : RF IC |
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2.5GHz RF IO with ESD cap. of 150fF. This design passed 5000V HBM, 300V MM, and 700V CDM. |
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Application into Designs Case II : Display Driver IC |
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| ESD performance of GTL IP for high voltage LCD driver IC.Passed 4000V HBM, 300V MM |
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Application into Designs Case III : Timing Controller |
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LVDS power domain in TCON design with GTL ESD IP.This design passed 8000V HBM, 400V MM, and 700V CDM |
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| Application into Designs Case III : Timing Controller |
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LVDS input pin in TCON design with GTL ESD IP.This design passed 8000V HBM, 400V MM, and 700V CDM. |
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